SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To increase the number of word lines to be simultaneously started in a stress test.SOLUTION: A semiconductor device includes: a memory cell array 30 which is divided into a plurality of memory cell mats MAT by a plurality of sense amplifier columns 32, and each of which includes a plurality of word lines WL; and a test circuit 25 which performs test control for simultaneously starting the plurality of word lines WL each of which is included in a plurality of selected memory cell mats MAT which are not adjacent to one another among the plurality of memory cell mats MAT. According to the present invention, loads to a driver circuit for driving the word lines or a power supply circuit for supplying operation voltage to the driver circuit are reduced in comparison with the case of starting many word lines in one memory cell mat since the memory cell mats MAT in which the plurality of word lines WL are started are distributed. As a result, it becomes possible to simultaneously start more word lines.