TRACE DATA ACQUISITION DEVICE, TRACE DATA ACQUISITION METHOD OF TRACE DATA ACQUISITION DEVICE, AND DEBUGGING SYSTEM

PROBLEM TO BE SOLVED: To efficiently acquire necessary trace data without stopping execution of an LSI nor dividing a program to be tested.SOLUTION: A trace data input/output state analysis part 140 selects types of trace data 101 in the decreasing order of priority based upon free capacity 102 of a...

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Hauptverfasser: KAMEMARU TOSHIHISA, ATOBE HIROSHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To efficiently acquire necessary trace data without stopping execution of an LSI nor dividing a program to be tested.SOLUTION: A trace data input/output state analysis part 140 selects types of trace data 101 in the decreasing order of priority based upon free capacity 102 of a trace data buffer 120. A trace data selection part 110 inputs trace data 101 from a trace signal generation source of LSI and determines whether the input trace data 101 is trace data 101 of a selected type. When the trace data 101 is the trace data 101 of the selected type, the trace data selection part 110 stores the trace data 101 in a trace data buffer 120. When the trace data 101 is not the trace data 101 of the selected type, the trace data selection part 110 discards the trace data 101.