SEMICONDUCTOR DEVICE, METHOD FOR TESTING SEMICONDUCTOR DEVICE, AND DATA PROCESSING SYSTEM

PROBLEM TO BE SOLVED: To measure parasitic resistance values of internal signal lines.SOLUTION: A semiconductor device has one or a plurality of internal signal lines 101 which electrically connect an interface chip with a core chip. The interface chip has a first circuit 111 which outputs current to internal wiring, and the core chip has a second circuit 121 which outputs current to a first internal signal line 101. The interface chip has a determination circuit 150 that includes a first input terminal 151a connected to the internal wiring to which current to be output by the first circuit 111 flows, and a second input terminal 151b connected to an end 101a in the interface chip of the first internal signal line 101, and that outputs voltage according to potential difference between voltage of the first input terminal 151a and voltage of a second input terminal 151b.