LAMINATE, METHOD FOR MANUFACTURING THE SAME, MANUFACTURING DEVICE AND METHOD FOR MEASURING FILM THICKNESS

PROBLEM TO BE SOLVED: To provide a laminate that can measure a film thickness of each film, and to provide a method for manufacturing the laminate and a method for measuring the film thickness that can inspect the film for failure by performing the film thickness measurement nondestructively and non...

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1. Verfasser: ITO KOJIRO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a laminate that can measure a film thickness of each film, and to provide a method for manufacturing the laminate and a method for measuring the film thickness that can inspect the film for failure by performing the film thickness measurement nondestructively and noncontactly.SOLUTION: The laminate is composed of a plurality of layers. An air space is formed in a prescribed position in relation to at least one of the plurality of layers.