PROBE UNIT

PROBLEM TO BE SOLVED: To provide a probe unit capable of easily performing a probe replacement.SOLUTION: A probe unit 1 comprises a pair of a plunger holder 30 and a probe holder 40. The plunger holder 30 holds a plurality of plungers 10, and the probe holder 40 holds a plurality of probes 20 corres...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	HOSHI MAKOTO, ARAI NOBUHISA, MARUYAMA MAO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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