PROBE UNIT
PROBLEM TO BE SOLVED: To provide a probe unit capable of easily performing a probe replacement.SOLUTION: A probe unit 1 comprises a pair of a plunger holder 30 and a probe holder 40. The plunger holder 30 holds a plurality of plungers 10, and the probe holder 40 holds a plurality of probes 20 corres...
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| creator | HOSHI MAKOTO ARAI NOBUHISA MARUYAMA MAO |
| description | PROBLEM TO BE SOLVED: To provide a probe unit capable of easily performing a probe replacement.SOLUTION: A probe unit 1 comprises a pair of a plunger holder 30 and a probe holder 40. The plunger holder 30 holds a plurality of plungers 10, and the probe holder 40 holds a plurality of probes 20 corresponding to the respective plungers 10. The probes 20 are held in the probe holder 40 so as to approach an inspection object from an inspection object facing surface 44 of the probe holder 40. The probes 20 are not fixed by screws or machine screws, etc. and are placed on a bottom surface of a probe housing recess room 45 with body parts thereof inserted into probe holding holes so that the probe unit 1 enables extremely easy replacement work of probes. |
| format | Patent |
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The probes 20 are not fixed by screws or machine screws, etc. and are placed on a bottom surface of a probe housing recess room 45 with body parts thereof inserted into probe holding holes so that the probe unit 1 enables extremely easy replacement work of probes.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120405&DB=EPODOC&CC=JP&NR=2012068076A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20120405&DB=EPODOC&CC=JP&NR=2012068076A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HOSHI MAKOTO</creatorcontrib><creatorcontrib>ARAI NOBUHISA</creatorcontrib><creatorcontrib>MARUYAMA MAO</creatorcontrib><title>PROBE UNIT</title><description>PROBLEM TO BE SOLVED: To provide a probe unit capable of easily performing a probe replacement.SOLUTION: A probe unit 1 comprises a pair of a plunger holder 30 and a probe holder 40. 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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | PROBE UNIT |
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