COMPOUND SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing the occurrence of a deposit on a surface of Au wiring even if the device is exposed to a high temperature.SOLUTION: Wiring coating layers 5 and 5', which cover a lower wiring layer 3a and an...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: YATABE CHIKARA, UMEZAWA TOSHIMASA, KAWAGUCHI KEIZO, HAMAGUCHI TOYOAKI
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing the occurrence of a deposit on a surface of Au wiring even if the device is exposed to a high temperature.SOLUTION: Wiring coating layers 5 and 5', which cover a lower wiring layer 3a and an upper wiring layer 3b composed of Au on or above a compound semiconductor substrate 1 and are composed of tantalum or titanium that is a metal having a smaller thin film stress than Au and having a high melting point than Au, are formed by sputter.