COMPUTER SYSTEM MANAGEMENT METHOD AND MANAGEMENT SYSTEM

PROBLEM TO BE SOLVED: To provide a failure analysis result classification function capable of reducing time required for recovery from a failure in a monitored device.SOLUTION: A failure analysis result (a failure cause candidate) obtained during failure analysis processing is analyzed to find which...

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Bibliographische Detailangaben
Hauptverfasser: NAGURA MASATAKA, NAGAI TAKAYUKI, SUGAUCHI KIMITOKU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a failure analysis result classification function capable of reducing time required for recovery from a failure in a monitored device.SOLUTION: A failure analysis result (a failure cause candidate) obtained during failure analysis processing is analyzed to find which failure cause candidates other than the failure cause candidate are related to a device abnormality failure event as grounds for deriving the failure cause candidate, so that the failure cause candidates are classified by each range of effect of being dealt therewith. Then, a classification result is displayed on a GUI.