SEMICONDUCTOR CIRCUIT DEVICE AND ERROR DETECTION CIRCUIT

PROBLEM TO BE SOLVED: To provide a semiconductor circuit device, which is suitable to perform an error detection of read out data row, in the semiconductor circuit device capable of reading out sequentially, per data row, data row stored in a series of memory cells arranged in a direction which is o...

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1. Verfasser: KATSUKI YOSUKE
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a semiconductor circuit device, which is suitable to perform an error detection of read out data row, in the semiconductor circuit device capable of reading out sequentially, per data row, data row stored in a series of memory cells arranged in a direction which is orthogonal to a direction when writing data.SOLUTION: An error detection circuit 43 of a semiconductor circuit device 1 includes line error detection circuits 50_0 to 50_n, and an error detection OR circuit 51. Each line error detection circuit reads out parity data PTD in a same cycle when reading out a first line of display data LCD_RD which synchronizes with a clock signal LCD_CK from an LCD and is sequentially read out from a memory cell array 21 per line, and sequentially performs exclusive OR operation between each bit data which is written in a row direction of each line sequentially read out per line and a last operation result, and outputs a final operation result for display data CPU_WD to the error detection OR circuit 51.