ASSEMBLY INSPECTION DEVICE, ASSEMBLY INSPECTION METHOD, AND ASSEMBLY INSPECTION PROGRAM

PROBLEM TO BE SOLVED: To provide an assembly inspection device capable of efficiently determining assembly with high precision.SOLUTION: The assembly inspection device includes: empty image storage means where an empty image of a body article is stored; set image storage means where a set image of a completely assembled article where articles to be assembled have been assembled in the body article is stored; inspection image storage means where an inspection image of an inspection article of which the assembled state should be inspected is stored; inspection area storage means where an inspection area is stored; index value calculation means which calculates indexes indicating characteristics of pixels within the inspection area of the inspection image on the basis of an empty brightness group comprising brightness of a plurality of color elements of the empty image within the inspection area and/or a set brightness group comprising brightness of the plurality of color elements of the set image within the inspection area, and an inspection brightness group comprising brightness of the plurality of color elements of the inspection image within the inspection area; index threshold storage means where an index threshold which is a threshold for index values and is set in accordance with the inspection area is stored; and assembly determination means which determines whether assembly of the inspection article is good or not on the basis of the index values and the index threshold.