MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR DESIGNING OPTICAL SURFACE

PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective in a microlithography projection exposure apparatus with respect to resolution at an illumination wavelength.SOLUTION: A microlithography projection optical system 101 includes a plurality of elements whic...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: MUANG HANS JURGEN, MARCO PRETORIUS, JULICH WILHELM
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator MUANG HANS JURGEN
MARCO PRETORIUS
JULICH WILHELM
description PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective in a microlithography projection exposure apparatus with respect to resolution at an illumination wavelength.SOLUTION: A microlithography projection optical system 101 includes a plurality of elements which are arranged so as to form an image of radiation light from an object plane 103 to an image plane 102, where at least one of these elements is a reflecting element which is located in a path of radiation light ad has a rotational asymmetrical surface. The rotational asymmetrical surface is deviated from a rotational symmetrical surface by approximately 10 nm or more.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2012008574A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2012008574A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2012008574A3</originalsourceid><addsrcrecordid>eNqNzD0LwjAUheEuDqL-h4tzhVotuobkpr2l-SBNhU6lSJxEC9X_bwURR6ezPOedR09F3JmKfGFyx2zRgnWmRO7JaDDWE2cV1G3tUcWgcGICpHGgmG4k475xpHMQeCKOMTAtfpHAmnL9Bt9S46YXLqPZpb-OYfXZRbSW6HmxCcO9C-PQn8MtPLrSpsk2TZJjdtiz3V_oBZagOck</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR DESIGNING OPTICAL SURFACE</title><source>esp@cenet</source><creator>MUANG HANS JURGEN ; MARCO PRETORIUS ; JULICH WILHELM</creator><creatorcontrib>MUANG HANS JURGEN ; MARCO PRETORIUS ; JULICH WILHELM</creatorcontrib><description>PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective in a microlithography projection exposure apparatus with respect to resolution at an illumination wavelength.SOLUTION: A microlithography projection optical system 101 includes a plurality of elements which are arranged so as to form an image of radiation light from an object plane 103 to an image plane 102, where at least one of these elements is a reflecting element which is located in a path of radiation light ad has a rotational asymmetrical surface. The rotational asymmetrical surface is deviated from a rotational symmetrical surface by approximately 10 nm or more.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2012</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20120112&amp;DB=EPODOC&amp;CC=JP&amp;NR=2012008574A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20120112&amp;DB=EPODOC&amp;CC=JP&amp;NR=2012008574A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MUANG HANS JURGEN</creatorcontrib><creatorcontrib>MARCO PRETORIUS</creatorcontrib><creatorcontrib>JULICH WILHELM</creatorcontrib><title>MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR DESIGNING OPTICAL SURFACE</title><description>PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective in a microlithography projection exposure apparatus with respect to resolution at an illumination wavelength.SOLUTION: A microlithography projection optical system 101 includes a plurality of elements which are arranged so as to form an image of radiation light from an object plane 103 to an image plane 102, where at least one of these elements is a reflecting element which is located in a path of radiation light ad has a rotational asymmetrical surface. The rotational asymmetrical surface is deviated from a rotational symmetrical surface by approximately 10 nm or more.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2012</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzD0LwjAUheEuDqL-h4tzhVotuobkpr2l-SBNhU6lSJxEC9X_bwURR6ezPOedR09F3JmKfGFyx2zRgnWmRO7JaDDWE2cV1G3tUcWgcGICpHGgmG4k475xpHMQeCKOMTAtfpHAmnL9Bt9S46YXLqPZpb-OYfXZRbSW6HmxCcO9C-PQn8MtPLrSpsk2TZJjdtiz3V_oBZagOck</recordid><startdate>20120112</startdate><enddate>20120112</enddate><creator>MUANG HANS JURGEN</creator><creator>MARCO PRETORIUS</creator><creator>JULICH WILHELM</creator><scope>EVB</scope></search><sort><creationdate>20120112</creationdate><title>MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR DESIGNING OPTICAL SURFACE</title><author>MUANG HANS JURGEN ; MARCO PRETORIUS ; JULICH WILHELM</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2012008574A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2012</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>MUANG HANS JURGEN</creatorcontrib><creatorcontrib>MARCO PRETORIUS</creatorcontrib><creatorcontrib>JULICH WILHELM</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MUANG HANS JURGEN</au><au>MARCO PRETORIUS</au><au>JULICH WILHELM</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR DESIGNING OPTICAL SURFACE</title><date>2012-01-12</date><risdate>2012</risdate><abstract>PROBLEM TO BE SOLVED: To improve an optical system which can be used as a projection objective in a microlithography projection exposure apparatus with respect to resolution at an illumination wavelength.SOLUTION: A microlithography projection optical system 101 includes a plurality of elements which are arranged so as to form an image of radiation light from an object plane 103 to an image plane 102, where at least one of these elements is a reflecting element which is located in a path of radiation light ad has a rotational asymmetrical surface. The rotational asymmetrical surface is deviated from a rotational symmetrical surface by approximately 10 nm or more.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2012008574A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
SEMICONDUCTOR DEVICES
title MICROLITHOGRAPHY PROJECTION OPTICAL SYSTEM, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR DESIGNING OPTICAL SURFACE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T16%3A38%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MUANG%20HANS%20JURGEN&rft.date=2012-01-12&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2012008574A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true