INSPECTION DEVICE, INSPECTION METHOD, AND MANUFACTURING METHOD OF CELL

PROBLEM TO BE SOLVED: To provide an inspection device, an inspection method, and a manufacturing method of a cell, allowing X-ray not to be leaked with a compact device configuration capable of detecting impurities or defects of an electrode sheet without contact.SOLUTION: An inspection device 10 co...

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Bibliographische Detailangaben
Hauptverfasser: KUWABARA KAZUKI, TANIZAKI TETSUYA, HAGINO TOMOO, ITO KIYOKAZU, NAKAMURA KAORI, FUJIMAKI HISATAKA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an inspection device, an inspection method, and a manufacturing method of a cell, allowing X-ray not to be leaked with a compact device configuration capable of detecting impurities or defects of an electrode sheet without contact.SOLUTION: An inspection device 10 comprises an inspection device main body 11, a base part 12 on which the inspection main body 11 is placed, an X-ray generator 15 and a detector 17 that are housed in the inspection device main body 11, and a first shielding plate 21 and a second shielding plate 31 that are shielding members respectively arranged at an upper side adjacent to the detector 17 and at a lower side adjacent to the X-ray generator 15 of an opening 11a of the inspection device main body 11. The X-ray generator 15 irradiates an X-ray r1 to an electrode sheet S continuously transported to be inserted into the inspection device main body, and the detector 17 detects the X-ray r1 passing through the electrode sheet S to inspect quality of the electrode sheet S.