CIRCUIT SIMULATION METHOD AND CIRCUIT SIMULATION APPARATUS

PROBLEM TO BE SOLVED: To provide a circuit simulation method for performing an accurate circuit simulation.SOLUTION: Voltage variation in the gate level is analyzed (step S2). The voltage variation in the gate level is analyzed for the entire chip TP. After the voltage variation is analyzed, then th...

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Bibliographische Detailangaben
1. Verfasser:	TANAKA GENICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a circuit simulation method for performing an accurate circuit simulation.SOLUTION: Voltage variation in the gate level is analyzed (step S2). The voltage variation in the gate level is analyzed for the entire chip TP. After the voltage variation is analyzed, then the voltage waveforms of power source voltage and ground voltage (Vss) are obtained (step S4). Then a signal in the transistor level is analyzed (step S6). The signal in the transistor level is analyzed for the range narrower than the entire chip TP, for example, not for the entire but one or more functional modules. After the signal is analyzed, then the signal analysis result is obtained (step S8).