TEMPERATURE MEASURING SYSTEM FOR LIGHT-EMITTING DIODE (LED) ASSEMBLY

PROBLEM TO BE SOLVED: To monitor an operation temperature at a junction between a p-type semiconductor and a n-type semiconductor in an LED to determine whether the LED is sufficiently radiating the heat so as to prevent an optical output reduction rate from increasing.SOLUTION: A temperature measur...

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Bibliographische Detailangaben
Hauptverfasser:	MOHAMED S AHMED, BRUCE A PELTON, MATTHEW EDWARD MOSTOLLER, ROBERT DAVID RICKS, RONALD MARTIN WEBER, STEVEN M JACKSON
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS SEMICONDUCTOR DEVICES TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To monitor an operation temperature at a junction between a p-type semiconductor and a n-type semiconductor in an LED to determine whether the LED is sufficiently radiating the heat so as to prevent an optical output reduction rate from increasing.SOLUTION: A temperature measuring system (100) has a temperature sensor (102) operably connected to an LED assembly (10) at a distant position apart from the junction of an LED (14). The temperature sensor (102) is constructed so as to measure a temperature of the LED assembly (10) at the distant position. A temperature calculation module (106) is operably connected to the temperature sensor (102) to receive from the temperature sensor (102) the temperature measured at the distant position. The temperature calculation module (106) is constructed so as to calculate a junction temperature at the LED junction based on the temperature measured at the distant position.