SUBSTRATE INSPECTING APPARATUS AND IMAGE FORMING APPARATUS

PROBLEM TO BE SOLVED: To allow inspection of a product program to be carried out while allowing efficient inspection using an inspection program, by separately storing the inspection program and the product program.SOLUTION: A substrate inspecting apparatus (substrate checker) 20 is equipped with an inspection memory 32 in which the inspection program is stored. A substrate 20 to be inspected which is to be connected to a substrate checker 24 is equipped with a product memory 31 in which the product program is stored. During the inspection, an inspection control unit 33 of the substrate checker 24 blocks a line connecting a CPU23 of the substrate 20 to be inspected and the product memory 31 and forms a line connecting the CPU23 and the inspection memory 32. A program running in the substrate 20 to be inspected is switched from the product program to the inspection program, and the inspection of the substrate using the inspection program is performed.