LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM
PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the dire...
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| creator | SAITO HITOSHI ONOE TAKESHI |
| description | PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the directivity of light emission of optical elements and a dust attachment fault.SOLUTION: A light emission measuring apparatus comprises an addressing means 41 for addressing one or plural light-receiving units from among a plurality of light-receiving units for imaging a light emission state of an LED, a light intensity determining means 42 that compares a value of an imaging signal from one or the plural light-receiving units specified by the addressing means 41 with a reference value, and when the value of the imaging signal is lower than the reference value, determines that the light intensity is not satisfactory, and when the value of the imaging signal is equal to or higher than the reference value, determines that the light intensity is satisfactory, and a directivity determining means 43 that compares the value of the imaging signal from one or plural light receiving units specified by the addressing means 41 with the reference value and determines whether the directivity of light emission of the LED is good or bad. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011216794A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011216794A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011216794A3</originalsourceid><addsrcrecordid>eNqNyz0LwjAUheEuDqL-h4tzBVtFcbwm1zTSfHCTzqVInEQLFX-_oq6C03mH54yzR61VFYGMDkE7C4YwNKytAvQeGWMTAK2En8xQrJzMQTgb2dXg2SlGk79fTChxX9MrhGP58VI3ZpqNzt1lSLPvTrL5gaKoFqm_tWnou1O6pnt79OWyKMpis92tcfUXegKj8Dne</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM</title><source>esp@cenet</source><creator>SAITO HITOSHI ; ONOE TAKESHI</creator><creatorcontrib>SAITO HITOSHI ; ONOE TAKESHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the directivity of light emission of optical elements and a dust attachment fault.SOLUTION: A light emission measuring apparatus comprises an addressing means 41 for addressing one or plural light-receiving units from among a plurality of light-receiving units for imaging a light emission state of an LED, a light intensity determining means 42 that compares a value of an imaging signal from one or the plural light-receiving units specified by the addressing means 41 with a reference value, and when the value of the imaging signal is lower than the reference value, determines that the light intensity is not satisfactory, and when the value of the imaging signal is equal to or higher than the reference value, determines that the light intensity is satisfactory, and a directivity determining means 43 that compares the value of the imaging signal from one or plural light receiving units specified by the addressing means 41 with the reference value and determines whether the directivity of light emission of the LED is good or bad.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; SEMICONDUCTOR DEVICES ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111027&DB=EPODOC&CC=JP&NR=2011216794A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20111027&DB=EPODOC&CC=JP&NR=2011216794A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SAITO HITOSHI</creatorcontrib><creatorcontrib>ONOE TAKESHI</creatorcontrib><title>LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM</title><description>PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the directivity of light emission of optical elements and a dust attachment fault.SOLUTION: A light emission measuring apparatus comprises an addressing means 41 for addressing one or plural light-receiving units from among a plurality of light-receiving units for imaging a light emission state of an LED, a light intensity determining means 42 that compares a value of an imaging signal from one or the plural light-receiving units specified by the addressing means 41 with a reference value, and when the value of the imaging signal is lower than the reference value, determines that the light intensity is not satisfactory, and when the value of the imaging signal is equal to or higher than the reference value, determines that the light intensity is satisfactory, and a directivity determining means 43 that compares the value of the imaging signal from one or plural light receiving units specified by the addressing means 41 with the reference value and determines whether the directivity of light emission of the LED is good or bad.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyz0LwjAUheEuDqL-h4tzBVtFcbwm1zTSfHCTzqVInEQLFX-_oq6C03mH54yzR61VFYGMDkE7C4YwNKytAvQeGWMTAK2En8xQrJzMQTgb2dXg2SlGk79fTChxX9MrhGP58VI3ZpqNzt1lSLPvTrL5gaKoFqm_tWnou1O6pnt79OWyKMpis92tcfUXegKj8Dne</recordid><startdate>20111027</startdate><enddate>20111027</enddate><creator>SAITO HITOSHI</creator><creator>ONOE TAKESHI</creator><scope>EVB</scope></search><sort><creationdate>20111027</creationdate><title>LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM</title><author>SAITO HITOSHI ; ONOE TAKESHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011216794A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>SAITO HITOSHI</creatorcontrib><creatorcontrib>ONOE TAKESHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAITO HITOSHI</au><au>ONOE TAKESHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM</title><date>2011-10-27</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the directivity of light emission of optical elements and a dust attachment fault.SOLUTION: A light emission measuring apparatus comprises an addressing means 41 for addressing one or plural light-receiving units from among a plurality of light-receiving units for imaging a light emission state of an LED, a light intensity determining means 42 that compares a value of an imaging signal from one or the plural light-receiving units specified by the addressing means 41 with a reference value, and when the value of the imaging signal is lower than the reference value, determines that the light intensity is not satisfactory, and when the value of the imaging signal is equal to or higher than the reference value, determines that the light intensity is satisfactory, and a directivity determining means 43 that compares the value of the imaging signal from one or plural light receiving units specified by the addressing means 41 with the reference value and determines whether the directivity of light emission of the LED is good or bad.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng |
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| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR |
| title | LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T09%3A06%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SAITO%20HITOSHI&rft.date=2011-10-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011216794A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |