LIGHT EMISSION MEASURING APPARATUS AND LIGHT EMISSION MEASURING METHOD, CONTROL PROGRAM, AND READABLE RECORDING MEDIUM

PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the dire...

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Bibliographische Detailangaben
Hauptverfasser: SAITO HITOSHI, ONOE TAKESHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To easily and accurately measure and inspect an amount of light emission of not only one optical element but also a plurality of optical elements without using a conventional discrimination ID circuit used so far, as well as to easily and accurately measure and inspect the directivity of light emission of optical elements and a dust attachment fault.SOLUTION: A light emission measuring apparatus comprises an addressing means 41 for addressing one or plural light-receiving units from among a plurality of light-receiving units for imaging a light emission state of an LED, a light intensity determining means 42 that compares a value of an imaging signal from one or the plural light-receiving units specified by the addressing means 41 with a reference value, and when the value of the imaging signal is lower than the reference value, determines that the light intensity is not satisfactory, and when the value of the imaging signal is equal to or higher than the reference value, determines that the light intensity is satisfactory, and a directivity determining means 43 that compares the value of the imaging signal from one or plural light receiving units specified by the addressing means 41 with the reference value and determines whether the directivity of light emission of the LED is good or bad.