FAILURE DETECTION METHOD, TESTING DEVICE, AND PROGRAM FOR SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To detect bridge failure, without having to use additional test pattern for detecting bridge failure and reduce omissions of bridge failure detection.SOLUTION: An input logical value is propagated to a scanning chain by shift operation of the scanning chain. Next, by inputting a clock pulse into a clock line, the input logical value is supplied from the scanning chain to a combined circuit. Subsequently, by measuring the power current of a semiconductor device with a potential of the clock line fixed at a predetermined potential, bridge failures are detected between the clock line and a signal line in the combined circuit. Additionally, by inputting a clock pulse into the clock line, an output logical value is propagated to the scanning chain. Finally, by observing the output logical value, degenerate fault or bridge failure is detected in the combined circuit.