SAMPLE STAND FOR ELECTRON MICROSCOPE
PROBLEM TO BE SOLVED: To provide a sample stand for an electron microscope allowing highly precise EBSD analysis.SOLUTION: This sample stand 31 for the electron microscope includes a pedestal 33 attached to a sample holder 9 attachable to a sample stage 5, a shaft 35 fixed perpendicular to the pedes...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a sample stand for an electron microscope allowing highly precise EBSD analysis.SOLUTION: This sample stand 31 for the electron microscope includes a pedestal 33 attached to a sample holder 9 attachable to a sample stage 5, a shaft 35 fixed perpendicular to the pedestal 33, a hollow member 37 formed with a hollow part 37a extended along an axial direction in a body inside, formed with at least one through-hole 41 on a body barrel part side face, inserted into the shaft 35 via the hollow part 37a, and rotatable along a circumferential direction of the shaft 35 under a condition inserted into the shaft 35, and a fixing member 39 inserted into the through hole 41 and for fixing a relative position of the hollow member 37 to the shaft 35, by supporting the shaft 35 and the hollow member 37. A sample 3 is attached onto an upper face of the hollow member 37. |
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