TEST METHOD AND TESTING DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT

TEST METHOD AND TESTING DEVICE OF SEMICONDUCTOR INTEGRATED CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To provide a test method and a testing device of a semiconductor integrated circuit capable of testing the semiconductor integrated circuit without generating overshoot of a supply voltage, and to provide the semiconductor integrated circuit.SOLUTION: This test method of the se...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: ICHINOSE SHIGENORI
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a test method and a testing device of a semiconductor integrated circuit capable of testing the semiconductor integrated circuit without generating overshoot of a supply voltage, and to provide the semiconductor integrated circuit.SOLUTION: This test method of the semiconductor integrated circuit for performing test by being driven in different driving frequencies f (ft, fs, 0) is constituted so that each driving frequency is changed stepwise, when changing the driving frequency.