LITHOGRAPHIC APPARATUS AND METHOD

PROBLEM TO BE SOLVED: To provide a lithographic apparatus having a detector with high signal stability. SOLUTION: There is provided the lithographic apparatus equipped with: an illumination system for providing a beam of radiation; a support structure for supporting patterning device, the patterning...

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Hauptverfasser: VAN DER VEEN PAUL, STOLK ROLAND PIETER
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creator VAN DER VEEN PAUL
STOLK ROLAND PIETER
description PROBLEM TO BE SOLVED: To provide a lithographic apparatus having a detector with high signal stability. SOLUTION: There is provided the lithographic apparatus equipped with: an illumination system for providing a beam of radiation; a support structure for supporting patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section; a substrate table for holding a substrate; and a detector configured to measure a property of the beam of radiation, the detector comprising first and second luminescent uniaxial crystals each having an optic axis, the optic axis of the first uniaxial crystal being arranged such that it is substantially perpendicular to the optic axis of the second uniaxial crystal. COPYRIGHT: (C)2011,JPO&INPIT
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011192988A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011192988A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011192988A3</originalsourceid><addsrcrecordid>eNrjZFD08Qzx8HcPcgzw8HRWcAwIcAxyDAkNVnD0c1HwdQVKufAwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ0NDSyNLCwtHY6IUAQBegSKx</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LITHOGRAPHIC APPARATUS AND METHOD</title><source>esp@cenet</source><creator>VAN DER VEEN PAUL ; STOLK ROLAND PIETER</creator><creatorcontrib>VAN DER VEEN PAUL ; STOLK ROLAND PIETER</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a lithographic apparatus having a detector with high signal stability. SOLUTION: There is provided the lithographic apparatus equipped with: an illumination system for providing a beam of radiation; a support structure for supporting patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section; a substrate table for holding a substrate; and a detector configured to measure a property of the beam of radiation, the detector comprising first and second luminescent uniaxial crystals each having an optic axis, the optic axis of the first uniaxial crystal being arranged such that it is substantially perpendicular to the optic axis of the second uniaxial crystal. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110929&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011192988A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20110929&amp;DB=EPODOC&amp;CC=JP&amp;NR=2011192988A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VAN DER VEEN PAUL</creatorcontrib><creatorcontrib>STOLK ROLAND PIETER</creatorcontrib><title>LITHOGRAPHIC APPARATUS AND METHOD</title><description>PROBLEM TO BE SOLVED: To provide a lithographic apparatus having a detector with high signal stability. SOLUTION: There is provided the lithographic apparatus equipped with: an illumination system for providing a beam of radiation; a support structure for supporting patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section; a substrate table for holding a substrate; and a detector configured to measure a property of the beam of radiation, the detector comprising first and second luminescent uniaxial crystals each having an optic axis, the optic axis of the first uniaxial crystal being arranged such that it is substantially perpendicular to the optic axis of the second uniaxial crystal. COPYRIGHT: (C)2011,JPO&amp;INPIT</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD08Qzx8HcPcgzw8HRWcAwIcAxyDAkNVnD0c1HwdQVKufAwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ0NDSyNLCwtHY6IUAQBegSKx</recordid><startdate>20110929</startdate><enddate>20110929</enddate><creator>VAN DER VEEN PAUL</creator><creator>STOLK ROLAND PIETER</creator><scope>EVB</scope></search><sort><creationdate>20110929</creationdate><title>LITHOGRAPHIC APPARATUS AND METHOD</title><author>VAN DER VEEN PAUL ; STOLK ROLAND PIETER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011192988A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>VAN DER VEEN PAUL</creatorcontrib><creatorcontrib>STOLK ROLAND PIETER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VAN DER VEEN PAUL</au><au>STOLK ROLAND PIETER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LITHOGRAPHIC APPARATUS AND METHOD</title><date>2011-09-29</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To provide a lithographic apparatus having a detector with high signal stability. SOLUTION: There is provided the lithographic apparatus equipped with: an illumination system for providing a beam of radiation; a support structure for supporting patterning device, the patterning device serving to impart the radiation beam with a pattern in its cross-section; a substrate table for holding a substrate; and a detector configured to measure a property of the beam of radiation, the detector comprising first and second luminescent uniaxial crystals each having an optic axis, the optic axis of the first uniaxial crystal being arranged such that it is substantially perpendicular to the optic axis of the second uniaxial crystal. COPYRIGHT: (C)2011,JPO&amp;INPIT</abstract><oa>free_for_read</oa></addata></record>
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subjects APPARATUS SPECIALLY ADAPTED THEREFOR
BASIC ELECTRIC ELEMENTS
CINEMATOGRAPHY
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
SEMICONDUCTOR DEVICES
title LITHOGRAPHIC APPARATUS AND METHOD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T06%3A16%3A01IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=VAN%20DER%20VEEN%20PAUL&rft.date=2011-09-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2011192988A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true