SEMICONDUCTOR DEVICE AND TESTING DEVICE OF THE SAME

PROBLEM TO BE SOLVED: To decide whether an over current protection value of a main current is within a normal range without a special test facility. SOLUTION: The semiconductor device 1 includes a main transistor 11 for making the main current I11 flow, a sub-transistor 21 for making the sub-current I21 flow, a control circuit 60 generating a drive signal IN_H common to both the transistors 11 and 21, an overcurrent protection circuit 70 comparing the sub-current I21 with a sub-current threshold and generating an overcurrent protection signal Socp to output it to the controlling circuit 60, and a drive circuit (circuit block group expressed by 41a, 41b, 50, 81 and 91) deciding whether on/off-operations should be applied to both the transistors 11 and 21 according to the drive signal IN_H, or after setting the transistor 11 to be turned off independently of the drive signal IN_H, whether on/off-operations are sould be applied to only the transistor 21 based on a switching signal TEST. COPYRIGHT: (C)2011,JPO&INPIT