DEVICE AND METHOD FOR MEASUREMENT PARAMETER INPUT CONTROL

PROBLEM TO BE SOLVED: To change measurement parameters which are set for a target device and are necessary for various measurement processings for intuitive, as well as, high operability. SOLUTION: The device includes: a parameter processing unit 2 which acquires measurement parameter information, i...

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Bibliographische Detailangaben
Hauptverfasser:	TAKEDA EIJI, MASUHARA KEITA, NISHIOHARA MASANORI, NIKI YOHEI, MURAKAMI TAKASHI
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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