DEVICE AND METHOD FOR MEASUREMENT PARAMETER INPUT CONTROL

PROBLEM TO BE SOLVED: To change measurement parameters which are set for a target device and are necessary for various measurement processings for intuitive, as well as, high operability. SOLUTION: The device includes: a parameter processing unit 2 which acquires measurement parameter information, i...

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Bibliographische Detailangaben
Hauptverfasser: TAKEDA EIJI, MASUHARA KEITA, NISHIOHARA MASANORI, NIKI YOHEI, MURAKAMI TAKASHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To change measurement parameters which are set for a target device and are necessary for various measurement processings for intuitive, as well as, high operability. SOLUTION: The device includes: a parameter processing unit 2 which acquires measurement parameter information, including the measurement parameters from the target device 10 and which rewrites changed parameters which are the measurement parameters, after changing to the target device 10; a parameter-identifying unit 3, which identifies the types of the parameters in the acquired measurement parameter information and outputs soft key constructing information for constructing a parameter setting soft key 20, based on the measurement parameter information identified; a display control unit 4, which has a soft key control means 4a for displaying and controlling the parameter-setting soft key 20, based on the measurement parameter information on a display screen of a display unit 6, on the basis of the soft key constructing information from the parameter-identifying unit 3; and an input unit 7, which operates the parameter-setting soft key 20 displayed on the display unit 6. COPYRIGHT: (C)2011,JPO&INPIT