DEVICE AND METHOD FOR MEASUREMENT PARAMETER INPUT CONTROL

PROBLEM TO BE SOLVED: To change measurement parameters which are set for a target device and are necessary for various measurement processings for intuitive, as well as, high operability. SOLUTION: The device includes: a parameter processing unit 2 which acquires measurement parameter information, i...

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Hauptverfasser:	TAKEDA EIJI, MASUHARA KEITA, NISHIOHARA MASANORI, NIKI YOHEI, MURAKAMI TAKASHI
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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creator	TAKEDA EIJI MASUHARA KEITA NISHIOHARA MASANORI NIKI YOHEI MURAKAMI TAKASHI
description	PROBLEM TO BE SOLVED: To change measurement parameters which are set for a target device and are necessary for various measurement processings for intuitive, as well as, high operability. SOLUTION: The device includes: a parameter processing unit 2 which acquires measurement parameter information, including the measurement parameters from the target device 10 and which rewrites changed parameters which are the measurement parameters, after changing to the target device 10; a parameter-identifying unit 3, which identifies the types of the parameters in the acquired measurement parameter information and outputs soft key constructing information for constructing a parameter setting soft key 20, based on the measurement parameter information identified; a display control unit 4, which has a soft key control means 4a for displaying and controlling the parameter-setting soft key 20, based on the measurement parameter information on a display screen of a display unit 6, on the basis of the soft key constructing information from the parameter-identifying unit 3; and an input unit 7, which operates the parameter-setting soft key 20 displayed on the display unit 6. COPYRIGHT: (C)2011,JPO&INPIT
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subjects	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
title	DEVICE AND METHOD FOR MEASUREMENT PARAMETER INPUT CONTROL
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