SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEMPERATURE CORRECTION METHOD THEREOF

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device and a temperature correction method thereof in which the temperature correction of a reference signal can be performed by a simple constitution. SOLUTION: Values of reference signals outputted from signal generating means 21,...

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Hauptverfasser: ABE MAKIO, MAJIMA YOSHIFUSA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device and a temperature correction method thereof in which the temperature correction of a reference signal can be performed by a simple constitution. SOLUTION: Values of reference signals outputted from signal generating means 21, 22 of a semiconductor integrated circuit are measured at three different temperatures, at least, and correction control data are determined which are applied to trimming means of the signal generating means for bringing the measured values of the reference signals to a target value. Correction control data at temperatures within a use temperature range of the semiconductor integrated circuit are then calculated from the correction control data which are obtained at the three temperatures to be applied to the trimming means of the signal generating means. The correction control data of the temperatures are stored in a storage means 56 correspondingly to the temperatures, the correction control data to be applied to the trimming means of the signal generating means are read from the storage means in accordance with a temperature detected by a temperature detecting means 23 of the semiconductor integrated circuit, and set to the trimming means of the signal generating means, thereby performing the temperature correction of the reference signals outputted from the signal generating means. COPYRIGHT: (C)2011,JPO&INPIT