ARRAY PROBE MEASURING METHOD AND ARRAY PROBE MEASURING INSTRUMENT

PROBLEM TO BE SOLVED: To provide an array probe measuring method for measuring a place away from the central reference line of a pair of probes in the state of discriminabilities being improved, and also to provide an array probe measuring instrument. SOLUTION: The array probe measuring method is co...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SHIBATA SABURO, KAJIGAYA ICHIRO, HIKICHI TATSUYA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!