ARRAY PROBE MEASURING METHOD AND ARRAY PROBE MEASURING INSTRUMENT
PROBLEM TO BE SOLVED: To provide an array probe measuring method for measuring a place away from the central reference line of a pair of probes in the state of discriminabilities being improved, and also to provide an array probe measuring instrument. SOLUTION: The array probe measuring method is co...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an array probe measuring method for measuring a place away from the central reference line of a pair of probes in the state of discriminabilities being improved, and also to provide an array probe measuring instrument. SOLUTION: The array probe measuring method is constituted so as to arrange, to an object A, an array probe 1 on a transmission side having a plurality of vibrators 1a arranged thereto, and an array probe 2 on a reception side having a plurality of vibrators 2a arranged thereto, so as to straddle the measuring place of the object A to detect the measuring place. The excitation pattern of a plurality of the vibrators 1a in the array probe 1 on the transmission side is differentiated from that of a plurality of the vibrators 2a in the array probe 2 on the reception side and the focal positions of transmission and reception of the array probe 1 on the transmission side and the array probe 2 on the reception side are set in a position away from the central reference line of the array probe 1 on the transmission side and the array probe 2 on the reception side. COPYRIGHT: (C)2011,JPO&INPIT |
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