LASER PATTERNING METHOD AND APPARATUS THEREFOR

PROBLEM TO BE SOLVED: To provide a laser patterning apparatus, wherein time loss during movement of a substrate is reduced to improve TAT (Turn Around Time) and defective machining due to focus deviation is reduced. SOLUTION: The laser patterning apparatus is provided with a mechanism which scans a...

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Bibliographische Detailangaben
Hauptverfasser: KOIZUMI MITSUYOSHI, YAMAGUCHI HIROKATSU, HONGO MIKIO, ARAKI MASAKI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a laser patterning apparatus, wherein time loss during movement of a substrate is reduced to improve TAT (Turn Around Time) and defective machining due to focus deviation is reduced. SOLUTION: The laser patterning apparatus is provided with a mechanism which scans a laser beam in a direction (subsidiary direction) vertical to a substrate scanning direction (main direction), and the scanning in the subsidiary direction is performed in accordance with the generation of laser pulse to allow the concurrent machining of a plurality of grooves by means of low-speed movement of the substrate, so that the time loss during movement of the substrate is reduced to improve the TAT and stability of focus control is improved to reduce the defective machining. COPYRIGHT: (C)2011,JPO&INPIT