VACUUM PROCESSOR AND GRAPH LINE DISPLAY METHOD

PROBLEM TO BE SOLVED: To compare a plurality of graphs in an overlapped manner. SOLUTION: On a screen 100, when graph lines 132 of a plurality of measurement values of vacuum processing have different peaks, first and second measure lines 101 and 102 are aligned with the peak of the other graph line...

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Bibliographische Detailangaben
Hauptverfasser: SARUWATARI JIRO, HIRAKI TSUTOMU, YAMANE KATSUMI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To compare a plurality of graphs in an overlapped manner. SOLUTION: On a screen 100, when graph lines 132 of a plurality of measurement values of vacuum processing have different peaks, first and second measure lines 101 and 102 are aligned with the peak of the other graph line 132, first and second time on an X axis where the first and the second measure lines 101 and 102 are located are displayed, the graph line 132 is selected and moved, the peak positions are aligned with each other, and the measurement values are compared. Thus, it is possible to correct the disturbance at a graph start point using noise, to achieve accurate comparison. It is possible to move the graph 132 while viewing a control signal or the shape of the graph line 132, thereby facilitating correction. COPYRIGHT: (C)2011,JPO&INPIT