PROCESS FOR PHOTOLITHOGRAPHY
PROBLEM TO BE SOLVED: To provide a new photoresist process, particularly suitable for immersion lithography. SOLUTION: The method for processing a photoresist composition includes: (a) applying on a substrate a photoresist composition; (b) subjecting the photoresist layer to immersion exposure to ra...
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creator | WANG DEYAN KANG DORIS SPIZUOCO KENNETH J ESTELLE THOMAS A BARCLAY GEORGE G |
description | PROBLEM TO BE SOLVED: To provide a new photoresist process, particularly suitable for immersion lithography. SOLUTION: The method for processing a photoresist composition includes: (a) applying on a substrate a photoresist composition; (b) subjecting the photoresist layer to immersion exposure to radiation activating for the photoresist composition; (c) adjusting a contact angle with water of the exposed photoresist layer; and (d) developing the processed photoresist layer to provide a photoresist relief image. COPYRIGHT: (C)2011,JPO&INPIT |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2011053650A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2011053650A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2011053650A3</originalsourceid><addsrcrecordid>eNrjZJAJCPJ3dg0OVnDzD1II8PAP8ffxDPHwdw9yDPCI5GFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGhgamxmamBo7GRCkCANGvIYA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROCESS FOR PHOTOLITHOGRAPHY</title><source>esp@cenet</source><creator>WANG DEYAN ; KANG DORIS ; SPIZUOCO KENNETH J ; ESTELLE THOMAS A ; BARCLAY GEORGE G</creator><creatorcontrib>WANG DEYAN ; KANG DORIS ; SPIZUOCO KENNETH J ; ESTELLE THOMAS A ; BARCLAY GEORGE G</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a new photoresist process, particularly suitable for immersion lithography. SOLUTION: The method for processing a photoresist composition includes: (a) applying on a substrate a photoresist composition; (b) subjecting the photoresist layer to immersion exposure to radiation activating for the photoresist composition; (c) adjusting a contact angle with water of the exposed photoresist layer; and (d) developing the processed photoresist layer to provide a photoresist relief image. COPYRIGHT: (C)2011,JPO&INPIT</description><language>eng</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2011</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110317&DB=EPODOC&CC=JP&NR=2011053650A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20110317&DB=EPODOC&CC=JP&NR=2011053650A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANG DEYAN</creatorcontrib><creatorcontrib>KANG DORIS</creatorcontrib><creatorcontrib>SPIZUOCO KENNETH J</creatorcontrib><creatorcontrib>ESTELLE THOMAS A</creatorcontrib><creatorcontrib>BARCLAY GEORGE G</creatorcontrib><title>PROCESS FOR PHOTOLITHOGRAPHY</title><description>PROBLEM TO BE SOLVED: To provide a new photoresist process, particularly suitable for immersion lithography. SOLUTION: The method for processing a photoresist composition includes: (a) applying on a substrate a photoresist composition; (b) subjecting the photoresist layer to immersion exposure to radiation activating for the photoresist composition; (c) adjusting a contact angle with water of the exposed photoresist layer; and (d) developing the processed photoresist layer to provide a photoresist relief image. COPYRIGHT: (C)2011,JPO&INPIT</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2011</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAJCPJ3dg0OVnDzD1II8PAP8ffxDPHwdw9yDPCI5GFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGhgamxmamBo7GRCkCANGvIYA</recordid><startdate>20110317</startdate><enddate>20110317</enddate><creator>WANG DEYAN</creator><creator>KANG DORIS</creator><creator>SPIZUOCO KENNETH J</creator><creator>ESTELLE THOMAS A</creator><creator>BARCLAY GEORGE G</creator><scope>EVB</scope></search><sort><creationdate>20110317</creationdate><title>PROCESS FOR PHOTOLITHOGRAPHY</title><author>WANG DEYAN ; KANG DORIS ; SPIZUOCO KENNETH J ; ESTELLE THOMAS A ; BARCLAY GEORGE G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2011053650A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2011</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>WANG DEYAN</creatorcontrib><creatorcontrib>KANG DORIS</creatorcontrib><creatorcontrib>SPIZUOCO KENNETH J</creatorcontrib><creatorcontrib>ESTELLE THOMAS A</creatorcontrib><creatorcontrib>BARCLAY GEORGE G</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANG DEYAN</au><au>KANG DORIS</au><au>SPIZUOCO KENNETH J</au><au>ESTELLE THOMAS A</au><au>BARCLAY GEORGE G</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROCESS FOR PHOTOLITHOGRAPHY</title><date>2011-03-17</date><risdate>2011</risdate><abstract>PROBLEM TO BE SOLVED: To provide a new photoresist process, particularly suitable for immersion lithography. SOLUTION: The method for processing a photoresist composition includes: (a) applying on a substrate a photoresist composition; (b) subjecting the photoresist layer to immersion exposure to radiation activating for the photoresist composition; (c) adjusting a contact angle with water of the exposed photoresist layer; and (d) developing the processed photoresist layer to provide a photoresist relief image. COPYRIGHT: (C)2011,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
title | PROCESS FOR PHOTOLITHOGRAPHY |
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