NANO IMPRINT METHOD, PATTERN FORMATION BODY, AND NANO IMPRINT SYSTEM

PROBLEM TO BE SOLVED: To provide a nano imprint method or the like which reduces defects by suppressing damage to resin when demolding. SOLUTION: A resin layer of electron ray curing resin is formed on a base material. A mold having a rough pattern is made to contact with the resin layer. The electr...

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Hauptverfasser: ITO KIMIO, HOGEN MORIHISA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a nano imprint method or the like which reduces defects by suppressing damage to resin when demolding. SOLUTION: A resin layer of electron ray curing resin is formed on a base material. A mold having a rough pattern is made to contact with the resin layer. The electron ray is radiated from at least either the base material side or the mold side to cure the resin layer. The resin layer and the mold are then detached from each other. COPYRIGHT: (C)2011,JPO&INPIT