BIT ERROR THRESHOLD AND REMAPPING OF MEMORY DEVICE

BIT ERROR THRESHOLD AND REMAPPING OF MEMORY DEVICE

PROBLEM TO BE SOLVED: To improve reliability by prolonging a life of a memory device to a life in many memory cells rather than that in a relatively small number of memory cells. SOLUTION: The method includes the steps of:determining a bit error rate and/or a number of bit errors associated with a s...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BOWERS STEPHEN, BILLING GURKIRAT
Format: Patent
Sprache:eng
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
INFORMATION STORAGE
PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To improve reliability by prolonging a life of a memory device to a life in many memory cells rather than that in a relatively small number of memory cells. SOLUTION: The method includes the steps of:determining a bit error rate and/or a number of bit errors associated with a signal indicating information read from a particular part of a memory; comparing the bit error rate and/or the number of bit errors with an error threshold; and determining whether to retire the particular part of the memory at least partially based on the comparison. COPYRIGHT: (C)2011,JPO&INPIT