SENSOR

PROBLEM TO BE SOLVED: To provide a low-cost sensor that can be utilized for general purposes as an inspection module for inspecting sample characteristics, and the like. SOLUTION: An inspection device 1 includes two CR parallel circuits connected in series, a power supply circuit section that applie...

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Bibliographische Detailangaben
1. Verfasser: KIMURA MASAHARU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a low-cost sensor that can be utilized for general purposes as an inspection module for inspecting sample characteristics, and the like. SOLUTION: An inspection device 1 includes two CR parallel circuits connected in series, a power supply circuit section that applies the rectangular-wave voltage to the two CR parallel circuits, and a voltage detection section 5 that detects the voltage at a connecting junction of the two CR parallel circuits. At least one of the two CR parallel circuits forms a pair of electrodes 11, 12 placed facing a sample interposed inbetween. COPYRIGHT: (C)2011,JPO&INPIT