MASS SPECTROMETER AND MASS SPECTROMETRY
PROBLEM TO BE SOLVED: To provide a mass spectrometer that can perform MS/MS measurement of components for analysis having various structural characteristics from a low-molecule component to a high-molecule component in one analysis operation, by cleaving samples of even unknown components at optimal...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a mass spectrometer that can perform MS/MS measurement of components for analysis having various structural characteristics from a low-molecule component to a high-molecule component in one analysis operation, by cleaving samples of even unknown components at optimal MS/MS conditions for each component, and capable of easily obtaining detailed structural information of subject components. SOLUTION: The mass spectrometer includes a means for ionizing components to be analyzed in a sample, an ion detector for detecting the precise mass number of ions generated, a collision cell carrying out collision-inducing cleavage reaction of the generated ions with collision gas, a control means for adjusting collision-inducing cleavage energy in the collision-inducing cleavage reaction of the ions with the collision gas, an ion detecting part for detecting precise mass of the ions generated, and a calculating part for calculating a molecular composition from the ion mass detected. The calculating part is able to classify the ions detected by their structural characteristics. COPYRIGHT: (C)2011,JPO&INPIT |
---|