SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor device that can improve resistance of a temperature sensing element against electrostatic breakdown and also can improve measurement precision.SOLUTION: The semiconductor device 100 includes: a plurality of temperature sensing element arrays 12 each i...

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Bibliographische Detailangaben
1. Verfasser:	KAJI NAOTO
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS SEMICONDUCTOR DEVICES TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a semiconductor device that can improve resistance of a temperature sensing element against electrostatic breakdown and also can improve measurement precision.SOLUTION: The semiconductor device 100 includes: a plurality of temperature sensing element arrays 12 each including temperature sensing elements 10 and a resistor 11 having one terminal connected to current input terminals of the temperature sensing elements 10, and connected to one another in parallel; and a first external terminal 14 to which other terminals of resistors 11 of the plurality of temperature sensing element arrays 12 are connected.