METHOD AND DEVICE FOR INSPECTION OF ARRAY SUBSTRATE

PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device capable of shortening an inspection time of an array substrate for a liquid crystal display device.SOLUTION: The array substrate 10 is divided into two inspection blocks 10A, 10B, and total two scanning signal lines 2 are...

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Bibliographische Detailangaben
Hauptverfasser:	MEGATA KEITOKU, TAGUCHI TOMOYUKI, NISHIYAMA HIROKI, KOMATSU SHUNICHI, IWAMI TSUKASA
Format:	Patent
Sprache:	eng
Schlagworte:	ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION FREQUENCY-CHANGING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device capable of shortening an inspection time of an array substrate for a liquid crystal display device.SOLUTION: The array substrate 10 is divided into two inspection blocks 10A, 10B, and total two scanning signal lines 2 are selected, respectively, from each inspection block, and inspected simultaneously, and thereby a pixel address of a defect candidate is specified. The array substrate 10 is divided into three inspection blocks 10C, 10D, 10E, and total three scanning signal lines 2 are selected each from each inspection block, and reinspected simultaneously, and thereby a pixel address of a defect candidate is specified. Then, a pixel address which is common between the first inspection and reinspection is specified as a bad address.