METHOD FOR ANALYZING MICROELEMENT IN TITANIUM-CONTAINING MATERIAL

PROBLEM TO BE SOLVED: To provide a technique for quantifying a very small amount of an impurity element in titanium alone or a material containing a titanium compound with high sensitivity by a low-cost simple method.SOLUTION: This method for analyzing a microelement in titanium-containing material...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	TANAKA MASAFUMI, SHIDARA HIROAKI, SUGIZAKI SHIGEAKI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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