METHOD FOR ANALYZING MICROELEMENT IN TITANIUM-CONTAINING MATERIAL

PROBLEM TO BE SOLVED: To provide a technique for quantifying a very small amount of an impurity element in titanium alone or a material containing a titanium compound with high sensitivity by a low-cost simple method.SOLUTION: This method for analyzing a microelement in titanium-containing material...

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Hauptverfasser: TANAKA MASAFUMI, SHIDARA HIROAKI, SUGIZAKI SHIGEAKI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a technique for quantifying a very small amount of an impurity element in titanium alone or a material containing a titanium compound with high sensitivity by a low-cost simple method.SOLUTION: This method for analyzing a microelement in titanium-containing material is composed of the process for preparing a granular or powdery analyzing raw material from titanium alone or the titanium-containing material, the process for dissolving the analyzing raw material by an acid with a concentration of 30 wt.% or above to prepare an acid solution, the process for diluting the acid solution by pure water to prepare an acid diluted solution with an acid concentration of 1-10 wt.%, the process for adding a precipitation suppressing substance to the acid diluted solution, the process for further diluting the acid diluted solution by pure water after the precipitation suppressing substance is added to the acid diluted solution to prepare an analyzing sample, and the process for quantitatively analyzing the impurity element in the analyzing sample. The analyzing sample contains both of 0.1-5.0 wt.% of the acid and 0.05-3.0 wt.% of the precipitation suppressing substance.