SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING THE SAME

SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR TESTING THE SAME

PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit and its test method, which change the number and combinations of memories which are simultaneously tested even after manufacture. SOLUTION: Access to the memories MEM1-MEMn is controlled by controlling a test sequence of the memorie...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KUSAKARI KEN, KOJIMA YOSHINARI
Format: Patent
Sprache:eng
Schlagworte:
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit and its test method, which change the number and combinations of memories which are simultaneously tested even after manufacture. SOLUTION: Access to the memories MEM1-MEMn is controlled by controlling a test sequence of the memories MEM1-MEMn by a test sequence control part 1 according to the test sequence setting from the outside, and by enabling/disabling chip enable signals CE1-CEn by a memory access control part 2 according to instructions from the test sequence control part 1. COPYRIGHT: (C)2011,JPO&INPIT