METHOD AND DEVICE FOR MEASURING PARTICLE-ON-GLASS PLATE END FACE

METHOD AND DEVICE FOR MEASURING PARTICLE-ON-GLASS PLATE END FACE

PROBLEM TO BE SOLVED: To provide a particle measuring method which mandates an inspection under severe conditions by previously suctioning and counting particles possibly generated from microcracks, as a result, finally enabling manufacture of non-defective glass plates, with particle generation ver...

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Bibliographische Detailangaben
Hauptverfasser: KAWAKITA ATSUSHI, KO HAKUSHO, RI RENSO, RI SHINEKI, SUGIMOTO TAKASHI, KANEDA NANAE, YAGUCHI RYUHEI, KAWASE KAZUMASA
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a particle measuring method which mandates an inspection under severe conditions by previously suctioning and counting particles possibly generated from microcracks, as a result, finally enabling manufacture of non-defective glass plates, with particle generation very much minimized. SOLUTION: In this method, a tip 11 of a resin tube 10 is slid, as being pressed against an end face Wa on the glass plate W to friction the glass plate end face for rubbing the particles off the end face, and then the rubbed particles are suctioned, and the number of which is counted through a particle counter 20. COPYRIGHT: (C)2011,JPO&INPIT