APPARATUS FOR DETECTION OF WAVEFORM PATTERN, COMPUTER PROGRAM, AND WAVEFORM PATTERN DETECTING METHOD

PROBLEM TO BE SOLVED: To detect a waveform pattern in real time by detecting the waveform pattern with a small amount of calculation. SOLUTION: Waveform feature value calculation units such as a unit 131 for calculating the number of rises, a unit 133 for calculating the number of falls and a unit 1...

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Bibliographische Detailangaben
Hauptverfasser: SHINOZAKI MAMORU, HOSOKAWA TAKEHIKO, YONEDA TAKAO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To detect a waveform pattern in real time by detecting the waveform pattern with a small amount of calculation. SOLUTION: Waveform feature value calculation units such as a unit 131 for calculating the number of rises, a unit 133 for calculating the number of falls and a unit 141 for calculating the number of inflections calculate a waveform feature value showing waveform pattern features of an object such as the number of rises, the number of falls and the number of inflections based on a series of waveform values showing the waveform pattern. A similarity calculation unit 182 calculates the degree of similarity based on the calculated waveform feature value and a comparative feature value showing features of a comparison pattern. A similarity decision unit 184 determines whether the object waveform pattern is close to the comparison pattern based on the calculated degree of similarity. COPYRIGHT: (C)2010,JPO&INPIT