VIRTUAL TEST SYSTEM CORRESPONDING TO SIMULTANEOUS TEST OF A PLURALITY OF DEVICE UNDER-TESTS (DUT)

PROBLEM TO BE SOLVED: To sufficiently debug an accurate test program. SOLUTION: A virtual test system includes: a plurality of semiconductor operation simulation models 201-1 to 201-32 provided corresponding to a plurality of the device under-tests (DUT); an operation simulation model 101 of an LSI...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	HIKICHI HIROSHI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!