DISPLACEMENT MEASURING DEVICE AND DISPLACEMENT MEASURING SYSTEM

PROBLEM TO BE SOLVED: To provide a displacement measuring device for measuring displacements in three directions in a simple structure, and to provide a displacement measuring system. SOLUTION: This displacement measuring device is disposed in a layer 4 formed between a floor 2 as a base and a ceili...

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Bibliographische Detailangaben
Hauptverfasser: SHOJI SHUICHI, NISHITANI AKIRA, NITA YOSHIHIRO, OHAKU IWAO, KATAMURA RYUTA, TANII TAKASHI, HATADA TOMOHIKO, TAKAHASHI GENICHI, SUZUKI YASUTSUGU, MATSUTANI IWAO, KANEKAWA KIYOSHI, MIURA SATORU
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a displacement measuring device for measuring displacements in three directions in a simple structure, and to provide a displacement measuring system. SOLUTION: This displacement measuring device is disposed in a layer 4 formed between a floor 2 as a base and a ceiling 3 of a building as a displacement detection target formed so as to face the floor 2. Accordingly, the displacement measuring device 1 detects displacements of the ceiling 3 in a horizontal direction H and a vertical direction z due to, for example, disaster such as earthquake on the basis of a deviation between reception positions of a first light beam L1 and a second light beam L2. COPYRIGHT: (C)2010,JPO&INPIT