CHITIN CRYSTALLINITY MEASUREMENT DEVICE

PROBLEM TO BE SOLVED: To provide a chitin crystallinity measurement device for measuring a chitin crystallinity on real time, particularly a chitin crystallinity measurement device for speedily measuring on line and feeding back to grinders or conveyers. SOLUTION: The chitin crystallinity measuremen...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TOTANI KAZUHIDE, INOMATA NAOHARU, KAIHARA MIKIO, NIKAIDO MITSURU
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a chitin crystallinity measurement device for measuring a chitin crystallinity on real time, particularly a chitin crystallinity measurement device for speedily measuring on line and feeding back to grinders or conveyers. SOLUTION: The chitin crystallinity measurement device includes a light source lamp 11 irradiating a chitin powder sample 2 with near-infrared light, an infrared sensor 12 detecting a light amount of the near-infrared light entering from the sample, a memory 16 recording a calibration curve prepared in advance, and calculation devices 17, 18 calculating a chitin crystallinity based on a detected result and the calibration curve, in which a near-infrared spectrum is obtained on the basis of the detected result of the infrared sensor 12, a secondary differentiation of the near-infrared spectrum is obtained as a transformed spectrum, and the chitin crystallinity is estimated by comparing an intensity of the transformed spectrum within a predetermined wavelength range with the calibration curve. COPYRIGHT: (C)2010,JPO&INPIT