SIGNAL GENERATION TIMING CONTROL PROGRAM AND INTEGRATED CIRCUIT PERFORMANCE TEST DEVICE

PROBLEM TO BE SOLVED: To provide a signal generation timing control program for reducing simultaneous operation signals due to simultaneous transmission of electric signals by accurately arranging pins on a programmable device functionally separated from a large scale integrated circuit to reconfigu...

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Bibliographische Detailangaben
Hauptverfasser: SHIRAISHI HIROAKI, TAKATOMI KOJI, YOTSUMARU TAKEO, TOKUNAGA TAKAKAZU
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a signal generation timing control program for reducing simultaneous operation signals due to simultaneous transmission of electric signals by accurately arranging pins on a programmable device functionally separated from a large scale integrated circuit to reconfigure a reconfiguration integrated circuit. SOLUTION: The signal generation timing controlling program makes a computer function as, a timing shift calculation means S200 which calculates a shift width by which the output timing on output pin side is shifted, within the range of clock frequency of the large scale integrated circuit based on the accepted input/output pin information and a block inserting means S300 which inserts, in a reconfiguration integrated circuit, a clock shift block as the block for shifting the timing of signal transmission on the output pin side of the programmable device based on the shift width calculated by the timing shift calculation means S200, on the basis of input/output pin information which is accepted by a means S100 for accepting input/output pin information for each of programmable devices having been functionally separated from a large scale integrated circuit. COPYRIGHT: (C)2010,JPO&INPIT