METHOD FOR PRODUCING INTERCONNECT STRUCTURES FOR INTEGRATED CIRCUITS

PROBLEM TO BE SOLVED: To provide a method for producing a semiconductor device which removes the overburden of barrier and conductive material using chemical mechanical polishing (CMP), thereby creating a larger process window to compensate for non-uniformity in deposition. SOLUTION: The method for...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: VAES JAN, HUYGHEBAERT CEDRIC, VAN OLMEN JAN
Format: Patent
Sprache:eng
Schlagworte:
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