SUBSTRATE FOR ELECTRONIC DEVICE, SURFACE INSPECTION METHOD OF SUBSTRATE FOR ELECTRONIC DEVICE AND METHOD OF INSPECTING ELECTRODE PATTERN ON SUBSTRATE FOR ELECTRONIC DEVICE

PROBLEM TO BE SOLVED: To provide a flexible substrate for an electronic device with a metal substrate and a flattened layer formed on the metal substrate, wherein a surface inspection of the substrate and an inspection of a formed electrode pattern are successfully performed with a minimized error....

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KITADA MINORU, ICHIMURA KOJI
Format:	Patent
Sprache:	eng
Schlagworte:	DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a flexible substrate for an electronic device with a metal substrate and a flattened layer formed on the metal substrate, wherein a surface inspection of the substrate and an inspection of a formed electrode pattern are successfully performed with a minimized error. SOLUTION: The substrate for the electronic device includes: the metal substrate; and a light absorbing layer which is formed on the metal substrate and exhibits absorptivity for wavelengths of at least part of light in the range of wavelength of 300 to 800 nm. COPYRIGHT: (C)2010,JPO&INPIT