CONTACT PROBE AND METHOD OF MANUFACTURING THE SAME

CONTACT PROBE AND METHOD OF MANUFACTURING THE SAME

PROBLEM TO BE SOLVED: To provide a contact probe having a contact part which has superior electric conductivity and abrasion resistance and a method of manufacturing the same. SOLUTION: The contact probe includes the contact part 4 and a beam part 3 for supporting the contact part 4. The contact par...

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Bibliographische Detailangaben
1. Verfasser: NAGATA KAZUSHI
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a contact probe having a contact part which has superior electric conductivity and abrasion resistance and a method of manufacturing the same. SOLUTION: The contact probe includes the contact part 4 and a beam part 3 for supporting the contact part 4. The contact part 4 is formed of a carbon composite plating layer 15 obtained by electroplating an electric conductive material in which carbon nanotubes are dispersed and mixed into electric conductive metal. The carbon composite plating layer 15 improves the abrasion resistance and electric conductivity of a contact part 43. COPYRIGHT: (C)2010,JPO&INPIT