METHOD FOR CONFIRMING ACCESS ADDRESS OF TEST PATTERN IN DIGITAL VIRTUAL TEST SYSTEM

PROBLEM TO BE SOLVED: To solve a problem that when transmitting a test pattern from an LSI tester in the LSI tester or an LSI tester simulation model, which range of an address area in a DUT memory is accessed can not be known and a defect of the test pattern cannot be previously detected. SOLUTION:...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	HIKICHI HIROSHI
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS STATIC STORES TESTING
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